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KMID : 0385520060190050407
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Analytical Science & Technology
2006 Volume.19 No. 5 p.407 ~ p.414
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Modification of conventional X-ray diffractometer for the measurement of phase distribution in a narrow region
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Park YS
Han SH/Kim JG/Jee KY/Kim WH
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Abstract
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KEYWORD
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micro X-ray diffraction, microbeam concentrator, narrow region, interface
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